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Sequential circuits BIST with status bit control

autor
Raik, Jaan
Orasson, Elmet
Ubar, Raimund-Johannes
vastutusandmed
J.Raik, E.Orasson, R.Ubar
allikas
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
ilmumiskoht
[S. l.]
ilmumisaasta
2004
leheküljed
p. 507-510 : ill
leitav
https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf
märksõna
digitaaltehnika
elektriahelad
testimine
ISBN
83-919289-7-7
märkused
Bibliogr.: 13 ref
keel
inglise
Raik, J., Orasson, E., Ubar, R.-J. Sequential circuits BIST with status bit control // Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004. [S. l.], 2004. p. 507-510 : ill. https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf