Hybrid BIST energy minimisation technique for system-on-chip testing

vastutusandmed
G.Jervan, Z.Peng, T.Shchenova and R.Ubar
allikas
IEE proceedings computers & digital techniques
ajakirja aastakäik number kuu
Vol. 153
ilmumisaasta
leheküljed
4, p. 208-216 : ill
ISSN
1350-2387
märkused
Bibliogr.: 37 ref
keel
inglise
Jervan, G., Peng, Z., Shchenova, T., Ubar, R.-J. Hybrid BIST energy minimisation technique for system-on-chip testing // IEE proceedings computers & digital techniques (2006) Vol. 153, 4, p. 208-216 : ill. https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=5ae755d323ccba87f8ff886334e3dd6d33560874