Defect oriented fault coverage of 100stuck-at fault test sets
autor
Blyzniuk, M.
Cibakova, Tatiana
Gramatova, Elena
Kuzmicz, W.
Lobur, M.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar
allikas
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
ilmumiskoht
[S. l.]
ilmumisaasta
2000
leheküljed
p. 511-516 : ill
ISBN
83-87202-37-1
märkused
Bibliogr.: 12 ref