Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes
autor
vastutusandmed
Andres Udal and Enn Velmre
allikas
Silicon carbide and related materials 2006
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 375-378
märkused
(Materials Science Forum, ISSN 1662-9752 ; 556/557)
TTÜ struktuuriüksus
keel
inglise
Udal, A., Velmre, E. Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes // Silicon carbide and related materials 2006. [S.l.] : Trans Tech Publications, 2007. p. 375-378.