An external diagnosis method for network-on-a-chip
                                            vastutusandmed
                                    
                                    
J.Raik, V.Govind, R.Ubar
                                                    
                                            
                                            allikas
                                    
                                    
IEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France
                                                    
                                            
                                            ilmumiskoht
                                    
                                    
Nice
                                                    
                                            
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
[2] p. : ill
                                                    
                                            
                                            konverentsi nimetus, aeg
                                    
                                    
DATE 2007, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring, April 16-20, 2007
                                                    
                                            
                                            konverentsi toimumispaik
                                    
                                    
Nice, France
                                                    
                                            
                                            märkused
                                    
                                    
Bibliogr.: 5 ref
                                                    
                                            
                                            keel
                                    
                                    
inglise
                                                    
                                            
                                            märksõna
                                    
                                    
                                
                            Raik, J., Govind, V., Ubar, R.-J. An external diagnosis method for network-on-a-chip // IEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France. Nice, 2007. [2] p. : ill.