Investigation of the silicon/polypyrrole interface by pulsed photoluminescence and IR spectroscopic ellipsometry during electrochemical deposition
vastutusandmed
Xin Zhang, Vitali Syritski, Guoguang Sun, Karsten Hinrichs and Jörg Rappich
ajakirja aastakäik number kuu
Vol. 24, S1
ilmumisaasta
leheküljed
p. 171
konverentsi nimetus, aeg
12th International PAT Conference, 29 September–2 October, 2013
konverentsi toimumispaik
Berlin, Germany
ISSN
1042-7147
märkused
Bibliogr.: 6 ref
Special Issue: 12th International PAT Conference, 29 September–2 October, 2013, Berlin, Germany
TTÜ struktuuriüksus
keel
inglise
Zhang, X., Sõritski, V., Sun, G., Hinrichs, K., Rappich, J. Investigation of the silicon/polypyrrole interface by pulsed photoluminescence and IR spectroscopic ellipsometry during electrochemical deposition // Polymers for advanced technologies (2013) Vol. 24, S1, p. 171.