Analysing the influence of temperature and pressure on corona loss of 330kV overhead tranmission line
autor                    
                    
                
vastutusandmed                    
                    
Pradeep Kumar Gupta
                            
                    
ilmumiskoht                    
                    
[Tallinn]
                            
                    
kirjastus/väljaandja                    
                    
                
ilmumisaasta                    
                    
                
leheküljed                    
                    
p. 79-80 : ill
                            
                    
konverentsi nimetus, aeg                    
                    
22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III, August 23-26, 2023
                            
                    
konverentsi toimumispaik                    
                    
Pärnu, Estonia
                            
                    
ISBN                    
                    
978-9916-80-028-7
                            
                    
märkused                    
                    
Bibliogr.: 2 ref
                            
                    
teaduspublikatsioon                    
                    
teaduspublikatsioon
                            
                    
klassifikaator                    
                    
                
TTÜ struktuuriüksus                    
                    
                
keel                    
                    
inglise
                            
                    
                            Gupta, P.K. Analysing the influence of temperature and pressure on corona loss of 330kV overhead tranmission line // 22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 2023. [Tallinn] : Tallinn University of Technology, 2023. p. 79-80 : ill.