prindi

Hierarchical identification of untestable faults in sequential circuits

autor
Raik, Jaan
Ubar, Raimund-Johannes
Krivenko, Anna
Kruus, Margus
vastutusandmed
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kruus
allikas
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
IEEE Computer Society
ilmumisaasta
2007
leheküljed
p. 668-671 : ill
konverentsi nimetus, aeg
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
konverentsi toimumispaik
Lübeck, Germany
leitav
http://dx.doi.org/10.1109/DSD.2007.4341539
märksõna
elektronlülitused
rikked
testimine
ISBN
978-0-7695-2978-3
märkused
Bibliogr.: 8 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Raik, J., Ubar, R.-J., Krivenko, A., Kruus, M. Hierarchical identification of untestable faults in sequential circuits // 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings. Los Alamitos : IEEE Computer Society, 2007. p. 668-671 : ill. http://dx.doi.org/10.1109/DSD.2007.4341539