prindi

Towards a unified model for test and design quality

autor
Aas, Einar J.
vastutusandmed
Einar J. Aas
allikas
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1996
leheküljed
p. 17-20: ill
ISBN
9985-59-026-0
märkused
Bibl. 8 ref
Aas, E.J. Towards a unified model for test and design quality // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 17-20: ill.