Hierarchical test generation with multi-level decision diagram models
autor
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
allikas
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
ilmumiskoht
[S.l.]
ilmumisaasta
1998
leheküljed
p. 26-33
keel
inglise