Parallel fault backtracing for calculation of fault coverage
vastutusandmed
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman
allikas
43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings
ilmumiskoht
Ljubljana
kirjastus/väljaandja
MIDEM
ilmumisaasta
leheküljed
p. 165-170 : ill
ISBN
978-961-91023-7-4
märkused
Bibliogr.: 17 ref
keel
inglise
Ubar, R.-J., Devadze, S., Raik, J., Jutman, A. Parallel fault backtracing for calculation of fault coverage // 43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings. Ljubljana : MIDEM, 2007. p. 165-170 : ill.