Decision diagrams and digital test

vastutusandmed
R.-J.Ubar
allikas
41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper
ilmumiskoht
Ribno at Bled
ilmumisaasta
leheküljed
p. 15-26
keel
inglise