From online fault detection to fault management in network-on-chips : a ground-up approach
autor
vastutusandmed
Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Nevin George, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Apneet Kaur, Jaan Raik, Gert Jervan, Raimund Ubar, Thomas Hollstein
allikas
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 48-53 : ill
konverentsi nimetus, aeg
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 19-21, 2017
konverentsi toimumispaik
Dresden, Germany
vormimärksõna
võtmesõna
fault classification
reconfiguration
ISSN
2473-2117
ISBN
978-1-5386-0471-7
märkused
Bibliogr.: 35 ref
TTÜ struktuuriüksus
keel
inglise
Azad, S.P., Niazmand, B., Janson, K., Nevin, G., Putkaradze, T., Oyeniran, A.S., - Apneet Kaur, Raik, J., Jervan, G., Ubar, R., Hollstein, T. From online fault detection to fault management in network-on-chips : a ground-up approach // Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany. Piscataway : IEEE, 2017. p. 48-53 : ill.