Test pattern generation at the behavioral level from VHDL circuit description containing several processes
autor
vastutusandmed
Elena Gramatova, Jana Bezakova, Tatiana Cibakova
ilmumiskoht
[Tallinn]
ilmumisaasta
leheküljed
p. 145-148
ISBN
9985-59-026-0
märkused
Bibl. 14 ref
Gramatova, E., Bezakova, J., Cibakova, T.* Test pattern generation at the behavioral level from VHDL circuit description containing several processes // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 145-148.