Calculation of testability measures on structurally synthesized binary decision diagrams
autor
Ubar, Raimund-Johannes
Heinlaid, J.
Raik, Jaan
Raun, L.
vastutusandmed
R.Ubar, J.Heinlaid, J.Raik, L.Raun
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 179-182: ill
ISBN
9985-59-081-3
märkused
Bibl. 13 ref