prindi

TMS320F28069-based impedance spectroscopy with binary excitation

autor
Rist, Marek
Reidla, Marko
Min, Mart
Parve, Toomas
Märtens, Olev
Land, Raul
vastutusandmed
M. Rist, M. Reidla, M. Min, T. Parve, O. Martens, R. Land
allikas
EDERC 2012 : proceedings of the 5th European DSP in Education & Research Conference : 13-14 September 2012, Amsterdam, The Netherlands
ilmumiskoht
Amsterdam
kirjastus/väljaandja
Texas Instruments
ilmumisaasta
2012
leheküljed
p. 217-220
konverentsi nimetus, aeg
EDERC 2012, 5th European DSP in Education & Research Conference, 13-14 September, 2012
konverentsi toimumispaik
Amsterdam, The Netherlands
leitav
https://ieeexplore.ieee.org/document/6532258
märksõna
impedantsspektroskoopia
signaalid
mõõtmine
Fourier' teisendus
ISBN
978-0-9573832-0-3
keel
inglise
Rist, M., Reidla, M., Min, M., Parve, T., Märtens, O., Land, R. TMS320F28069-based impedance spectroscopy with binary excitation // EDERC 2012 : proceedings of the 5th European DSP in Education & Research Conference : 13-14 September 2012, Amsterdam, The Netherlands. Amsterdam : Texas Instruments, 2012. p. 217-220. https://ieeexplore.ieee.org/document/6532258