kompaktne vaade prindi

A synthesis-agnostic behavioral fault model for high gate-level fault coverage

autor
Karputkin, Anton
Raik, Jaan
vastutusandmed
Anton Karputkin, Jaan Raik
allikas
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
EDAA
ilmumisaasta
2016
leheküljed
p. 1124-1127 : ill
konverentsi nimetus, aeg
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 14-18 March, 2016
konverentsi toimumispaik
Dresden, Germany
leitav
https://ieeexplore.ieee.org/document/7459477/figures#figures
märksõna
arvutisüsteemid
rikked
testimine
ISSN
1558-1101
ISBN
978-3-9815370-6-2
märkused
Bibliogr.: 19 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Karputkin, A., Raik, J. A synthesis-agnostic behavioral fault model for high gate-level fault coverage // 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings. [S.l.] : EDAA, 2016. p. 1124-1127 : ill. https://ieeexplore.ieee.org/document/7459477/figures#figures