A BIST scheme for testing mixed analogue and digital circuits
autor
Robson, Malcolm
Russel, Gordon
vastutusandmed
M.Robson, G.Russel
allikas
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1996
leheküljed
p. 183-186: ill
ISBN
9985-59-026-0
märkused
Bibl. 5 ref