An approach to model development for embedded testing
autor
Timohovich, E.
vastutusandmed
E.Timohovich
allikas
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
ilmumiskoht
Tallinn
ilmumisaasta
1994
leheküljed
p. 353-358
ISBN
9985-59-012-0
märkused
Bibl. 17 ref