prindi

Test generation for digital systems at functional level

autor
Ubar, Raimund-Johannes
Kuchcinski, Ktzysztof
Peng, Z.
vastutusandmed
R.Ubar, K.Kuchcinski, Z.Peng
allikas
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
ilmumisaasta
1990
leheküljed
p. 1-21
märksõna
digitaaltehnika
testimine
keel
inglise
Ubar, R., Kuchcinski, K., Peng, Z. Test generation for digital systems at functional level // Research report LiTH-IDA-R-90-06, Linköping University, Sweden., 1990. p. 1-21.