Deterministic defect-oriented test generation for combinational circuits

vastutusandmed
Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz
allikas
LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]
ilmumiskoht
[S. l.]
ilmumisaasta
leheküljed
p. 325-330 : ill
märkused
Bibliogr.: 10 ref