Recombination behaviour at the ultra-thin polypyrrole film/silicon interface investigated by in-situ pulsed photoluminescence
vastutusandmed
Carl Matthias Intelmann, Karsten Hinrichs, Vitali Syritski, Florent Yang and Jörg Rappich
ajakirja aastakäik number kuu
47
ilmumisaasta
leheküljed
2, p. 554-557
ISSN
0021-4922
märkused
Bibliogr.: 19 ref
keel
inglise
Intelmann, C.M., Hinrichs, K., Sõritski, V., Yang, F., Rappich, J. Recombination behaviour at the ultra-thin polypyrrole film/silicon interface investigated by in-situ pulsed photoluminescence // Japanese journal of applied physics (2008) 47, 2, p. 554-557.