prindi

Comparison of two approaches to improve functional BIST fault coverage

autor
Kostin, Sergei
Ubar, Raimund-Johannes
Gorev, Maksim
Mägi, Gunnar
vastutusandmed
Sergei Kostin, Raimund Ubar, Maksim Gorev, Gunnar Mägi
allikas
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
ilmumiskoht
Tallinn
kirjastus/väljaandja
Tallinn University of Technology
ilmumisaasta
2014
leheküljed
p. 105-108 : ill
konverentsi nimetus, aeg
2014 14th Biennial Baltic Electronics Conference, October 6-8, 2014
konverentsi toimumispaik
Tallinn University of Technology
märksõna
digitaaltehnika
teimimine
võtmesõna
functional BIST
hybrid BIST
design for testability
controllability
test point insertion
ISSN
1736-3705
ISBN
978-9949-23-672-5
märkused
Bibliogr.: 26 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Kostin, S., Ubar, R., Gorev, M., Mägi, G. Comparison of two approaches to improve functional BIST fault coverage // BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2014. p. 105-108 : ill.