Machine learning clustering techniques for selective mitigation of critical design features
vastutusandmed
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
leheküljed
7 p. : ill
konverentsi nimetus, aeg
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), July 13-16, 2020
konverentsi toimumispaik
Napoli, Italy
ISBN
9781728181875
märkused
Bibliogr.: 12 ref
TTÜ struktuuriüksus
keel
inglise
võtmesõna
terms-transient faults
single-event upsets
selective mitigation
selective hardening
soft error protection
Uurimisrühm
Lange, T., Balakrishnan, A., Glorieux, M. et al. Machine learning clustering techniques for selective mitigation of critical design features // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 7 p. : ill.