Structural decision diagrams in digital test : theory and applications
vastutusandmed
Raimund Ubar, Jaan Raik, Maksim Jenihhin, Artur Jutman
ilmumiskoht
Cham
kirjastus/väljaandja
ilmumisaasta
leheküljed
xiii, 595 lk. : ill.
seeria-sari
Computer Science Foundations and Applied Logic
märksõna
võtmesõna
Structural Decision Diagrams for Modeling Digital Circuits
Boolean Algebra Meets Graph-Theory
High-level Decision Diagrams for Modeling Digital Systems
Applications in Test Engineering
Parallel Fault Simulation with Critical Path Backtracing
Multi-valued Simulation for Hazard Detection in Digital Circuits
Test Group Generation for Detecting Multiple Faults
Avoiding Mutual Masking of Multiple Faults
Cross-level Modeling of Faults in Digital Systems
Hierarchical Multi-level Test Generation
Automated Synthesis of Software-based Self-test
Implementation-Independent Testing of Microprocessors
ISBN
978-3-031-44733-4
ISSN
2731-5754
teaduspublikatsioon
teaduspublikatsioon
klassifikaator
TTÜ struktuuriüksus
keel
inglise
Uurimisrühm
Ubar, R., Raik, J., Jenihhin, M., Jutman, A. Structural decision diagrams in digital test : theory and applications. Cham : Birkhäuser, 2024. xiii, 595 lk. : ill.. (Computer Science Foundations and Applied Logic).