Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278

Efficient methodology for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece2019 / p. 255-256 https://doi.org/10.1109/IOLTS.2019.8854449

IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 Conference proceeding at Scopus Article at Scopus Article at WOS

LiD-CAT: A lightweight detector for cache ATtacksReinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepulveda, Johanna2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020
Tallinn, Estonia : proceedings2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131603

Memristive device based circuits for computation-in-memory architecturesLebdeh, Muath Abu; Reinsalu, Uljana; Nguyen, Hoang Anh Du; Wong, Stephan; Hamdioui, Said2019 IEEE International Symposium on Circuits and Systems (ISCAS) : proceedings2019 / 5 p. : ill https://doi.org/10.1109/ISCAS.2019.8702542 Conference proceedings at Scopus Article at Scopus Article at WOS

Modeling soft-error reliability under variabilityBalakrishnan, Aneesh; Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Hamdioui, Said; Jenihhin, Maksim; Alexandrescu, Dan2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 20212021 / p. 1-6 https://doi.org/10.1109/DFT52944.2021.9568295

On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

A security verification template to assess cache architecture vulnerabilitiesGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, M.2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), April 22nd – 24th 2020 Novi Sad, Serbia : Proceedings2020 / art. 9095707, 6 p https://doi.org/10.1109/DDECS50862.2020.9095707

Survey on architectural attacks : a unified classification and attack modelGhasempouri, Tara; Raik, Jaan; Reinbrecht, Cezar; Hamdioui, Said; Hamdioui, SaidACM Computing Surveys2023 / art. 42 https://doi.org/10.1145/3604803 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Verifying cache architecture vulnerabilities using a formal security verification flowGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, MottaqiallahMicroelectronics reliability2021 / art. 114085 https://doi.org/10.1016/j.microrel.2021.114085 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS