Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ionsLohner, Tivador; Angelov, Christo; Mikli, ValdekThin solid films2008 / 22, p. 8009-8012 https://www.sciencedirect.com/science/article/pii/S0040609008003660

Raman scattering characterization of ion-beam synthesized Mg2Si. 1, Influence of the technological conditions on the formation of the Mg2Si in(100) Si matrixAtanassov, Alexander; Zlateva, Genoveva; Baleva, Mitra; Goranova, Ekaterina; Amov, Blagoj; Angelov, Christo; Mikli, ValdekPlasma processes and polymers2006 / 2, p. 219-223 : ill https://onlinelibrary.wiley.com/doi/pdf/10.1002/ppap.200500088

Study of ion implanted Fe depth distribution in Si after pulsed ion beam treatmentAngelov, Christo; Georgiev, S.; Amov, Blagoj; Goranova, E.; Mikli, Valdek; Dezsi, I.; Kotai, E.Journal of optoelectronics and advanced materials2007 / 2, p. 307-310 https://www.researchgate.net/publication/289186791_Study_of_the_ion_implanted_Fe_depth_distribution_in_Si_after_pulsed_ion_beam_treatment