Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill https://doi.org/10.1016/j.micpro.2012.11.004 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS