Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaicsYakushev, M.V.; Maiello, P.; Raadik, Taavi; Krustok, JüriThin solid films2014 / p. 195-199 : ill https://doi.org/10.1016/j.tsf.2014.04.057 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS