Influence of excitonic scattering on charge carrier ambipolar diffusion in siliconUdal, Andres; Velmre, EnnESSDERC'97 : proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 19971997 / p. 212-215: ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1503333 https://doi.org////10.1109/ESSDERC.1997.194403