Numerical simulation of electrothermal effects in ESD protection devicesHellström, Sven; Freidin, Boris; Velmre, Enn; Udal, AndresESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings1992 / p. 77-80 https://d-nb.info/921228503/04

Sonar with digital signal processingArro, IlmarMicrosystem Technologies 961996 / p. 829-831