Dynamic analysis of digital circuits with 5-valued simulationUbar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 187-192: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_29

Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20