Otsing - TalTech teadusportaal

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Applying e-environments in teaching the basics of digital logicRobal, Tarmo; Kalja, AhtoProceedings MSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : 3-4 June 2007, San Diego, CA2007 / p. 41-42 : ill https://ieeexplore.ieee.org/document/4231440/keywords#keywords

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Enhancing object modelling technique with timing analysis capabilitiesMõtus, Leo; Kinksaar, Riho; Näks, Tõnu; Pall, MartinFirst IEEE International Conference on Engineering Complex Computer Systems : Ft. Lauderdale, Florida, USA, November 6-10, 19951995 / p. 298-301

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Equivalent sets of functions of multiple valued logicHenno, JaakThe Twelfth International Symposium on Multiple-Valued Logic, May 25-27, 1982 ... Paris, France : proceedings1982 / p. 25-27

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4

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Formal timing analysis of OMT designs using LIMITSMõtus, Leo; Näks, TõnuThird International Workshop on Object-Oriented Real-Time Dependable Systems, February5-7, 1997, Newport Beach, California, USA1997 / p. 137-144

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5

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Graduate School in Information and Communication Technologies : experiences at Tallinn University of TechnologyJervan, Gert; Kruus, Margus; Rüstern, EnnuProceedings MSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : 3-4 June 2007, San Diego, CA2007 / p. 25-26

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6

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HDL-s for students with different backgroundReinsalu, Uljana; Arhipov, Anton; Evartson, Teet; Ellervee, PeeterProceedings MSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : 3-4 June 2007, San Diego, CA2007 / p. 69-70 https://ieeexplore.ieee.org/document/4231454

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Higher order 1-bit Sigma-Delta modulation on a circleGraf, Olga; Krahmer, Felix; Krause-Solberg, Sara2019 International Conference on Sampling Theory and Applications (SampTA) : 13th International Conference : Bordeaux, France, July 8-12, 2019 : [proceedings]2019 / 5 p https://sampta2019.sciencesconf.org/browse/author?authorid=715157

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High-level path activation technique to speed up sequential circuit test generationRaik, Jaan; Ubar, Raimund-JohannesEuropean Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany1999 / p. 84-89 : ill

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On some norms and approximation properties of Kantorovich-type sampling operatorsGraf, Olga; Tamberg, Gert2019 International Conference on Sampling Theory and Applications (SampTA) : 13th International Conference : Bordeaux, France, July 8-12, 2019 : [proceedings]2019 / 4 p https://sampta2019.sciencesconf.org/browse/author?authorid=715157

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On the cosine operator function framework of windowed Shannon sampling operatorsSaksa, Anna; Kivinukk, Andi; Graf, Olga2019 International Conference on Sampling Theory and Applications (SampTA) : 13th International Conference : Bordeaux, France, July 8-12, 2019 : [proceedings]2019 / 4 p https://sampta2019.sciencesconf.org/browse/author?authorid=715157

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Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

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Supporting evolving multi-agent systems with a system evolution directoryLu, B.; Sterling, Leon; Taveter, KuldarProceedings of the 19th Australian Software Engineering Conference (ASWEC 2008) : Perth, Western Australia, March 26-28, 20082008 / p. 180-189 https://ieeexplore.ieee.org/document/4483206

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Teaching Software-intensive embedded systems at Tallinn Technical UniversityMõtus, LeoReal-Time Systems in Education III : November 21, 1998, Poznan, Poland : proceedings1999 / p. 30-35

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Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

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Ultra fast parallel fault analysis on structurally synthesized BDDsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 131-136 : ill http://dx.doi.org/10.1109/ETS.2007.43

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Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan2008 / p. 21-26 : ill http://dx.doi.org/10.1109/ATS.2008.22

artikkel kogumikus

IEEE Computer Society Press (kirjastus/väljaandja)

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