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• Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill
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• Computational aspects of nodal method for simulation of electronic circuitsLaksberg, Edgar1983
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• Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est
• Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill
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• Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS
• Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuitsJenihhin, Maksim1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania2015 / [1] p
• Impulss-seadmed : laboratoorne töö nr. 5 : trigerid loogikaelementidel1986 https://www.ester.ee/record=b1240931*est
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• Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435
• Low frequency acoustic method to measure the complex bulk modulus of porous materialsNapolitano, Marialuisa; Di Giulio, Elio; Auriemma, FabioThe Journal of the Acoustical Society of America2022 / art. 1545 https://doi.org/10.1121/10.0009767 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS
• Modeling and simulation of circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan; Viies, VladimirMicroprocessors and microsystems2017 / p. 56-61 : ill https://doi.org/10.1016/j.micpro.2016.09.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS
• Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287
• Multiple fault analyses in logic circuitsUbar, Raimund-JohannesIFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 771977 / p. [?]
• Organ bio-impedance modelling with 3D mesh of equivalent circuitsGordon, RaunoProceedings of the XII International Conference on Electrical Bioimpedance & the V Conference on Electrical Impedance Tomography : ICEBI/EIT 2004 : June 20-24, 2004, Gdansk, Poland. Vol. 22004 / p. 715-718
• Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est
• Product and manufacturing in electronics : supplementary material in the subject "Technologies of electronic circuits"Rang, Toomas2003 https://www.ester.ee/record=b1766953*est
• Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405
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• A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
• 7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill
• Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406
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• State of charge estimation for Li-ion batteries based on equivalent circuit diagrams and the application of a Kalman filterRahmoun, Ahmad; Biechl, Helmuth; Rosin, Argo12th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Kuressaare, Estonia, June 11-16, 20122012 / p. 125-128 : ill
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• Диалоговая система моделирования электронных схем "ПОИСК"Laksberg, Edgar; Nelus, K.; Ess, ViktorМетоды и устройства регистрации, передачи, обработки и представления информации1986 / с. 63-68
• Единый подход к синтезу тестов цифровых схем и системUbar, Raimund-JohannesМежреспубликанская школа-семинар по технической диагностике, 8-12 октября 1984 года : тезисы докладов1984 / с. 75-81 : илл https://www.ester.ee/record=b1237891*est
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