Comprehensive performance and robustness analysis of 2D turn models for network-on-chips
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Kogge, Thilo
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2017 IEEE International Symposium on Circuits and Systems (ISCAS)
2017
/
p. 1476-1479 : ill
https://doi.org/10.1109/ISCAS.2017.8050634
https://www.scopus.com/sourceid/56190
https://www.scopus.com/record/display.uri?eid=2-s2.0-85032697758&origin=inward&txGid=dda03cc1450744ab538f2e32b253fba8
https://www.webofscience.com/wos/woscc/full-record/WOS:000424890101140