• A theoretical study of electron drift mobility anisotropy in n-type 4H- and 6H-SiCVelmre, Enn; Udal, AndresAbstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA1999 / paper no 395, 2 p https://www.researchgate.net/publication/250338907_A_Theoretical_Study_of_Electron_Drift_Mobility_Anisotropy_in_n-Type_4H-and_6H-SiC
• A theoretical study of electron drift mobility anisotropy in n-type 4H- and 6H-SiCVelmre, Enn; Udal, AndresProceedings of the International Conference on Silicon Carbide and Related Materials - 1999 (ICSCRM'99) : Research Triangle Park, North-Carolina, USA, Oct. 10-15, 1999. Vol. 12000 / p. 725-728
• Can electrical phenomena be explained with the concept of an "electric family tree"?Järvik, Jaan18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 45-46 : ill https://www.ester.ee/record=b5183874*est
• Change in the parameters of electron-irradiated 4H-SIC Schottky diodes as a function of the time during low-temperature isothermal annealingKorolkov, Oleg; Kozlovski, Vitali V.; Lebedev, Alexander A.; Toompuu, Jana; Sleptsuk, Natalja; Rang, ToomasSilicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK2019 / p. 734-737 https://doi.org/10.4028/www.scientific.net/MSF.963.734 https://www.scopus.com/sourceid/28700 https://www.scopus.com/record/display.uri?eid=2-s2.0-85071874502&origin=inward&txGid=a726a88a134fd68a3198db192e8c9ce6
• Comparative results of low temperature annealing of lightly doped n-layers of silicon carbide irradiated by protons and electronsKozlovski, Vitali V.; Korolkov, Oleg; Lebedev, Alexander A.; Toompuu, Jana; Sleptsuk, NataljaSilicon Carbide and Related Materials 2019 : 18th International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019), Kyoto, Japan, September 29 - October 4, 20192020 / p. 231-236 https://doi.org/10.4028/www.scientific.net/MSF.1004.231 https://www.scopus.com/sourceid/28700 https://www.scopus.com/record/display.uri?eid=2-s2.0-85089817325&origin=resultslist&sort=plf-f&src=s&sid=a6fb1194242752ab2b252272d233250c&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22comparative+results+of+low+temperature%22%29&sl=23&sessionSearchId=a6fb1194242752ab2b252272d233250c&relpos=0
• Corrected accounting of electron-hole scattering in cross-term current equations for Si and SiCVelmre, Enn; Udal, AndresPhysica scripta1999 / Proceedings of 18th Nordic Semiconductor Meeting, Linköping, Sweden, June 7-10, 1998, ISBN 91-87308-71-1, p. 193-197: ill https://ui.adsabs.harvard.edu/abs/1999PhST...79..193V/abstract
• Corrected accounting of electron-hole scattering in cross-term current equations for Si and SiCVelmre, Enn; Udal, Andres18th Nordic Semiconductor Meeting, Linköping, June 7-10, 1998 : abstracts1998 / p. F-88: ill https://iopscience.iop.org/article/10.1238/Physica.Topical.079a00193
• Electron-beam welding of high-entropy alloy and stainless steel: microstructure and mechanical propertiesSokkalingam, Rathinavelu; Mastanaiah, P.; Muthupandi, Veerappan; Sivaprasad, Katakam; Prashanth, Konda GokuldossMaterials and manufacturing processes2020 / p. 1885-1894 https://doi.org/10.1080/10426914.2020.1802045 https://www.scopus.com/sourceid/21054 https://www.scopus.com/record/display.uri?eid=2-s2.0-85089454936&origin=inward&txGid=249b410e2add61e3b9a11341cb9a98ae https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MATER%20MANUF%20PROCESS&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000558967900001
• Fluorene- and fluorenone-based molecules as electron-transporting SAMs for photovoltaic devicesSvirskaite, Lauryna Monika; Kasparavicius, Ernestas; Steponaitis, Matas; Grzibovskis, Raitis; Franckevicius, Marius; Katerski, Atanas; Naujokaitis, Arnas; Karazhanov, Smagul; Gopi, Sajeesh Vadakkedath; Aizstrauts, ArtursRSC advances2024 / p. 14973-14981 https://doi.org/10.1039/D4RA00964A https://www.scopus.com/sourceid/21100199840 https://www.scopus.com/pages/publications/85193052978?inward https://jcr.clarivate.com/jcr-jp/journal-profile?journal=RSC%20ADV&year=2024 https://www.webofscience.com/wos/woscc/full-record/WOS:001217748800001
• Growth of ultra-thin amorphous Al2O3 films on CoAl(1 0 0)Rose, V.; Podgurski, Vitali; Costina, Ioan; Franchy, R.Surface science2003 / p. 128-136 https://www.sciencedirect.com/science/article/pii/S0039602803008914
• Low-temperature annealing of lightly doped n-4H-SiC layers after irradiation with fast electronsKorolkov, Oleg; Kozlovski, Vitali V.; Lebedev, Alexander A.; Sleptšuk, Natalja; Toompuu, Jana; Rang, ToomasSemiconductors2019 / p. 975−978 https://doi.org/10.1134/S1063782619070133 https://www.scopus.com/sourceid/29834 https://www.scopus.com/record/display.uri?eid=2-s2.0-85068585613&origin=inward&txGid=3377015e7d50ef7770bff2c1af848b0e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SEMICONDUCTORS%2B&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000474481600021
• Rein Munter: Vesi mäletabMunter, ReinTähenduse Teejuhid2021 / Lk. 9 https://teejuhid.postimees.ee/7319813/rein-munter-vesi-maletab
• Sb2S3 solar cells with TiO2 electron transporting layers synthesized by ALD and USP methodsDedova, Tatjana; Krautmann, Robert; Rusu, Marin; Katerski, Atanas; Krunks, Malle; Unold, Thomas; Spalatu, Nicolae; Mere, Arvo; Sydorenko, Jekaterina; Sibinski, Maciej; Oja Acik, IlonaSolar energy materials and solar cells2025 / art. 113279 https://doi.org/10.1016/j.solmat.2024.113279
• The interplay of long range interactions and electron density distributions in polar and strongly correlated materialsKristoffel, Nikolai; Pishtshev, Aleksandr; Rubin, Pavel; Klopov, MihhailJournal of superconductivity and novel magnetism2017 / p. 91-96 : ill https://doi.org/10.1007/s10948-016-3765-y https://www.scopus.com/sourceid/5100154501 https://www.scopus.com/record/display.uri?eid=2-s2.0-84984885380&origin=inward&txGid=2daebc474a35e4bef305dbf59938f2c7 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20SUPERCOND%20NOV%20MAGN&year=2017 https://www.webofscience.com/wos/woscc/full-record/WOS:000392300600015
• UFG microstructure processing by ECAP from double electron-beam melted rare metalKommel, LembitNanomaterials by severe plastic deformation IV. Part 12008 / p. 349-354 : ill https://www.scientific.net/MSF.584-586.349
• Valgus muudeti lõpuks aineksKrustok, JüriEesti Päevaleht1997 / 28. sept., lk. 6 https://dea.digar.ee/article/eestipaevaleht/1997/09/28/13.2
• Влияние донорной примеси на характеристики электрон-фононного взаимодействия к-центров в сульфиде кадмияKrustok, Jüri; Lõo, A.; Piibe, ToomasTallinna Tehnikaülikooli Toimetised1990 / lk. 23-29: ill
• Влияние облучения низкоэнергетическими электронами в растровом электронном микроскопе на параметры полупроводниковых приборовMeiler, Boriss; Kropman, Daniel; Levtšenkova, AllaМикроэлектроника1987 / с. 165-169 : илл https://www.ester.ee/record=b2147720*est
• Лавинное размножение носителей заряда в дополнительных р-п-переходахVelmre, EnnРасчет и проектирование приборов, устройств и систем технической кибернетики1981 / с. 3-14 : илл https://www.ester.ee/record=b1319172*est https://digikogu.taltech.ee/et/Item/4c9b1559-97b9-4d9b-bac8-6c40840ba442
• О возможности определения времени жизни фотоэлектронов и квантового выхода в поликристаллическом сульфиде кадмияKukk, Peeter-Enn; Varvas, JüriСборник статей по химии и химической технологии. 111964 / с. 237-243 : илл https://www.ester.ee/record=b2181984*est https://digikogu.taltech.ee/et/Item/958b7e78-6cf4-425c-b75d-b028262eada8
• Приближенный метод определения времени жизни неравновесных электронов в сульфиде кадмияVarvas, Jüri; Kukk, Peeter-EnnСборник статей по химии и химической технологии. 101964 / с. 257-266 : илл https://www.ester.ee/record=b2181961*est https://digikogu.taltech.ee/et/Item/9569e6db-150a-42c8-bf3b-765725dfd969
• Расчет показателя степени в формуле МиллераVelmre, EnnТруды по электротехнике и автоматике : сборник статей. 111973 / с. 145-154 : илл https://www.ester.ee/record=b2190624*est https://digikogu.taltech.ee/et/Item/d6e57925-e104-44e1-a218-c5b3110d9996