• LiD-CAT: A lightweight detector for cache ATtacksReinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepulveda, Johanna2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020 Tallinn, Estonia : proceedings2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131603
• A security verification template to assess cache architecture vulnerabilitiesGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, M.2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), April 22nd – 24th 2020 Novi Sad, Serbia : Proceedings2020 / art. 9095707, 6 p https://doi.org/10.1109/DDECS50862.2020.9095707
• Survey on architectural attacks : a unified classification and attack modelGhasempouri, Tara; Raik, Jaan; Reinbrecht, Cezar; Hamdioui, Said; Hamdioui, SaidACM Computing Surveys2023 / art. 42 https://doi.org/10.1145/3604803 https://www.scopus.com/sourceid/23038 https://www.scopus.com/record/display.uri?eid=2-s2.0-85174677921&origin=resultslist&sort=plf-f&src=s&sid=5017a1c9d633ac6f0480b4ae72b5920a&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22Survey+on+Architectural+Attacks%3A+A+Unified+Classification+and+Attack+Model%22%29&sl=91&sessionSearchId=5017a1c9d633ac6f0480b4ae72b5920a&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ACM%20COMPUT%20SURV&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001085637600017
• Towards formal verification of cache access-based side-channel attacksNiazmand, Behrad; Reinbrecht, Cezar; Raik, Jaan; Jervan, Gert; Sepulveda, JohannaTestmethoden und Zuverlässigkeit von Schaltungen und Systemen, TUZ 20192019 / 2 p. : tab http://www.informatik.uni-bremen.de/tuz/2019
• Verifying cache architecture vulnerabilities using a formal security verification flowGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, MottaqiallahMicroelectronics reliability2021 / art. 114085 https://doi.org/10.1016/j.microrel.2021.114085 https://www.scopus.com/sourceid/26717 https://www.scopus.com/record/display.uri?eid=2-s2.0-85102872009&origin=inward&txGid=bbbec1675d4df7951ad6c8a70f214a97 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000637756900007