• Ways for board and system test to benefit from FPGA embedded instrumentationEhrenberg, Heiko; Odintsov, Sergei; Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Wenzel, Thomas2019 IEEE AUTOTESTCON2019 / 10 p : ill https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057