• Benchmarking advanced security closure of physical layoutsEslami, Mohammad; Knechtel, Johann; Sinanoglu, Ozgur; Karri, Ramesh; Pagliarini, Samuel NascimentoISPD '23 : proceedings of the 2023 International Symposium on Physical Design2023 / p. 256-264 https://doi.org/10.1145/3569052.3578924 https://dl.acm.org/doi/pdf/10.1145/3569052.3578924
• On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseksEslami, Mohammad2024 https://www.ester.ee/record=b5701420*est https://doi.org/10.23658/taltech.53/2024 https://digikogu.taltech.ee/et/Item/068530be-4810-4489-9604-fb838d298b45
• Reusing verification assertions as security checkers for Hardware Trojan detectionEslami, Mohammad; Ghasempouri, Tara; Pagliarini, Samuel Nascimento2022 23rd International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA : 06-07 April 20222022 / p. 1-6 : ill https://doi.org/10.1109/ISQED54688.2022.9806292
• SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201
• SCARF : securing chips with a robust framework against fabrication-time hardware trojansEslami, Mohammad; Ghasempouri, Tara; Pagliarini, Samuel NascimentoIEEE Transactions on Computers2024 / p. 2761-2775 https://doi.org/10.1109/TC.2024.3449082 https://www.scopus.com/sourceid/25033 https://www.scopus.com/record/display.uri?eid=2-s2.0-85201752061&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22SCARF%3A+Securing+Chips+With+a+Robust+Framework+Against+Fabrication-Time+Hardware+Trojans%22%29&sessionSearchId=7f45e0ec132af76c064c755f1de85733&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20COMPUT&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001351576000009
• SCARF : securing chips with a robust framework against fabrication-time hardware Trojans : preprintEslami, Mohammad; Ghasempouri, Tara; Pagliarini, Samuel NascimentoarXiv.org2024 / 14 p. : ill https://doi.org/10.48550/arXiv.2402.12162