Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
https://www.scopus.com/sourceid/15552
https://www.scopus.com/record/display.uri?eid=2-s2.0-85086377299&origin=inward&txGid=f742e708555546cb12b9117a6e274d64
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000571530400009