Split-chip design to prevent IP reverse engineering
Pagliarini, Samuel Nascimento
;
Sweeney, Joseph
;
Mai, Ken
;
Blanton, Shawn
;
Mitra, Subhasish
;
Pileggi, Larry
IEEE Design and Test
2020
/
p. 109-118
https://doi.org/10.1109/MDAT.2020.3033255
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/record/display.uri?eid=2-s2.0-85095985466&origin=inward&txGid=5cd9b065fa2590c9dd1c7c529d74978c
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000678331400021