Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85041489163&origin=inward&txGid=8f2d9e894f22f2945d867ef5424f7212
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000425576300030