• Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 20182018 / p. 1104–1108 : ill https://doi.org/10.1109/APEC.2018.8341154 https://www.scopus.com/sourceid/31003 https://www.scopus.com/record/display.uri?eid=2-s2.0-85046961445&origin=inward&txGid=c53c63c11f97844f2154b630947cd99a https://www.webofscience.com/wos/woscc/full-record/WOS:000434981901045