Impact of orientation on the bias of SRAM-based PUFs
Abideen, Zain Ul
;
Wang, Rui
;
Perez, Tiago Diadami
;
Schrijen, Geert-Jan
;
Pagliarini, Samuel Nascimento
IEEE design & test
2024
/
p. 14-20
https://doi.org/10.1109/MDAT.2023.3322621
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/pages/publications/85174806397?inward
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2024
https://www.webofscience.com/wos/woscc/full-record/WOS:001209578000006