Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Cherezova, Natalia
;
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
Microelectronics reliability
2023
/
art. 115010, 10 p. : ill
https://doi.org/10.1016/j.microrel.2023.115010
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001