Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
https://doi.org/10.1007/s10836-016-5589-x
https://www.scopus.com/sourceid/18040
https://www.scopus.com/record/display.uri?eid=2-s2.0-84966714453&origin=inward&txGid=3b4ba7ac260a393cbe6bed59b4d314b9
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016
https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900004