Optimization of boundary scan tests using FPGA-based efficient scan architectures
Aleksejev, Igor
;
Devadze, Sergei
;
Jutman, Artur
;
Shibin, Konstantin
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 245-255 : ill
https://doi.org/10.1007/s10836-016-5588-y
https://www.scopus.com/sourceid/18040
https://www.scopus.com/record/display.uri?eid=2-s2.0-84964452131&origin=inward&txGid=035b6825dd1a37b925ec9c823fcecd7d
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016
https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900002