ECS an endeavor towards providing similar cache reliability behavior in different programs
Ahmadilivani, Mohammad Hasan
;
Jahromi, Mohammad Moeini
;
Salehi, Mostafa E.
;
Kargar, Mona
Microelectronics Reliability
2024
/
art. 115295
https://doi.org/10.1016/j.microrel.2023.115295
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85178337397&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1016%2Fj.microrel.2023.115295%29&sessionSearchId=0b9f9fcd32592ba1f53a2482eaa5a072&relpos=0
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001165956700001