Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
Selg, Hardi
;
Shibin, Konstantin
;
Tsertov, Anton
;
Jenihhin, Maksim
;
Ellervee, Peeter
;
Raik, Jaan
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2024
https://doi.org/10.1109/DFT63277.2024.10753541
https://www.scopus.com/record/display.uri?eid=2-s2.0-85212426533&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FDFT63277.2024.10753541%29&sessionSearchId=f890857a41c36254c0f644edbb3c2ac3&relpos=0