Automated design error debug using high-level decision diagrams and mutation operators
Raik, Jaan
;
Repinski, Urmas
;
Tšepurov, Anton
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Microprocessors and microsystems
2013
/
p. 505-513 : ill
https://doi.org/10.1016/j.micpro.2012.11.004
https://www.scopus.com/sourceid/15552
https://www.scopus.com/record/display.uri?eid=2-s2.0-84878621727&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1016%2Fj.micpro.2012.11.004%29&sessionSearchId=81bea3cc7c86d66922f228affe5df51e
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2013
https://www.webofscience.com/wos/woscc/full-record/WOS:000324667900012